Crack like defect characterization based on the scattering coefficient distribution using ultrasonic arrays

Tao Meng, Benchun Yao, Deguo Wang, J. Jiao
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Abstract

The use of ultrasonic arrays to characterize defects is an important area in non-destructive evaluation. In this paper, the scattering coefficient calculation model of the defect is built by using subarray transmitter-receiver pair. Then an approach of crack like defect characterization based on the scattering coefficient distribution is developed in the light of study on the relationship between scattering coefficient and direction of defect. The full focusing image from the full matrix capture data obtained to determine the location of the defect. Then, scattering coefficient distribution was deduced to extract the information on the crack like defect orientation by dividing the linear array into a certain number of subarrays. Results in simulation show that the crack like defect characterization method is effective.
基于超声阵列散射系数分布的类裂纹缺陷表征
利用超声阵列对缺陷进行表征是无损检测的一个重要领域。本文采用子阵列收发对建立了缺陷散射系数计算模型。然后在研究散射系数与缺陷方向关系的基础上,提出了一种基于散射系数分布的类裂纹缺陷表征方法。从全矩阵采集数据中获得全聚焦图像,确定缺陷的位置。然后,通过将线性阵列划分为一定数量的子阵列,推导散射系数分布,提取类裂纹缺陷的方向信息;仿真结果表明,类裂纹缺陷表征方法是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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