S. Mohapatra, P. Sahu, N. Murty
{"title":"Numerical Modeling of Native Defects in CVD Grown Diamond Photodetectors","authors":"S. Mohapatra, P. Sahu, N. Murty","doi":"10.1109/EDKCON.2018.8770414","DOIUrl":null,"url":null,"abstract":"Diamond based photoconductors intended for use as radiation detectors are simulated in this work in SYNOPSYS© Sentaurus TCAD. Simulations are carried out by including the model of native defects for single-crystal and poly-crystal diamond detectors grown by CVD process. The models are validated by comparing the simulations with the reported experimental data. The explanation of the results in terms of the diamond band-gap and the comparative analysis of the dark currents of both the detectors have also been presented. The temperature dependant simulation is also presented to substantiate the developed model at high temperature.","PeriodicalId":344143,"journal":{"name":"2018 IEEE Electron Devices Kolkata Conference (EDKCON)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Electron Devices Kolkata Conference (EDKCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDKCON.2018.8770414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
CVD生长金刚石光电探测器中固有缺陷的数值模拟
本研究在SYNOPSYS©Sentaurus TCAD中模拟了用于辐射探测器的金刚石基光导体。通过引入CVD法生长的单晶和多晶金刚石探测器的固有缺陷模型进行了仿真。通过与实验数据的比较,验证了模型的正确性。从金刚石带隙的角度对结果进行了解释,并对两种探测器的暗电流进行了对比分析。在高温条件下进行了与温度相关的模拟,验证了模型的正确性。
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