HEMT Small-Signal Modelling for Voltage-Controlled Attenuator Applications

Abstract

Multi-bias measured and simulated S parameters are presented to validate the extension of an accurate on/off state HEMT switch small-signal modelling procedure to analog attenuator applications. Good agreements between measured and simulated multi-bias S parameters of the HEMT with a gate resistor are achieved by using only a common-gate real test-structure (without the gate resistor), which not only confirm the validity of the modelling for both digital and analog attenuator applications, but also validate the applicability of the capacitance network and extraction methods under more bias conditions.