Full measurement of the stokes parameters of a light beam using on-chip silicon nanoantennas

A. Espinosa-Soria, S. Mas, A. Griol, F. J. Rodríguez-Fortuño, A. Martínez
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引用次数: 1

Abstract

Beam polarimetry is a versatile tool in optical technology enabling the measurement of the light polarization state. In this work, we demonstrate an on-chip polarization analyzer working at telecom wavelengths that allows for a direct measurement of the Stokes parameters of an incoming plane wave. The analyzer consists of three silicon nanoantennas coupled to three waveguides (having six outputs) so that each nanoantenna responds to a certain polarization state by changing the amount of optical power coupled to each waveguide as well as the direction of propagation along the coupled waveguide.
利用片上硅纳米天线对光束的斯托克斯参数进行全面测量
光束偏振法是光学技术中的一种多功能工具,可以测量光的偏振状态。在这项工作中,我们展示了一种在电信波长下工作的片上偏振分析仪,该分析仪允许直接测量入射平面波的斯托克斯参数。分析仪由三个硅纳米天线耦合到三个波导(有六个输出)组成,每个纳米天线通过改变耦合到每个波导的光功率量以及沿耦合波导的传播方向来响应一定的偏振状态。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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