{"title":"Pulsed-latch circuits to push the envelope of ASIC design","authors":"Seungwhun Paik, Youngsoo Shin","doi":"10.1109/SOCDC.2010.5682949","DOIUrl":null,"url":null,"abstract":"The use of the slow and power-consuming flip-flops is one of the factors that cause a large gap between custom and ASIC designs. A pulsed-latch, which is a latch driven by a brief pulse clock, inherits the advantage of latch while allowing us to use a simple timing model similar to that of flip-flop. As a result, it offers the opportunity of higher performance and lower power consumption within the conventional ASIC design environment. We address challenges and problems specific to pulsed-latch ASIC, and review potential solutions. Some quantitative results are provided to assess the effectiveness of pulsed-latch circuits.","PeriodicalId":380183,"journal":{"name":"2010 International SoC Design Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International SoC Design Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCDC.2010.5682949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
The use of the slow and power-consuming flip-flops is one of the factors that cause a large gap between custom and ASIC designs. A pulsed-latch, which is a latch driven by a brief pulse clock, inherits the advantage of latch while allowing us to use a simple timing model similar to that of flip-flop. As a result, it offers the opportunity of higher performance and lower power consumption within the conventional ASIC design environment. We address challenges and problems specific to pulsed-latch ASIC, and review potential solutions. Some quantitative results are provided to assess the effectiveness of pulsed-latch circuits.