Operation modes of the GaN HEMT in high-frequency half-bridge converter

M. Zdanowski, J. Rąbkowski
{"title":"Operation modes of the GaN HEMT in high-frequency half-bridge converter","authors":"M. Zdanowski, J. Rąbkowski","doi":"10.1109/PAEE.2016.7605115","DOIUrl":null,"url":null,"abstract":"This paper presents a study of the GaN HEMT switching features conducted with the use of the half-bridge test converter rated at 2,5 kW. Results of simulation performed in LTSpice are verified by a series of experimental tests at the variable input voltage (up to 400 V) and switching frequency (up to 250 kHz). Three switch scenarios were analyzed: HEMT without the anti-parallel diode, HEMT with an anti-parallel SiC Schottky and HEMT with an additional parallel capacitor. Presented waveforms of drain-source voltage and drain current during switching processes and results of power losses measurements show significant reduction of switching power losses when anti-parallel diode or additional capacitor are applied. Furthermore, an impact of the dead-time length on power losses is also discussed and an optimal choice for assumed parameters of the converter is presented.","PeriodicalId":165474,"journal":{"name":"2016 Progress in Applied Electrical Engineering (PAEE)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Progress in Applied Electrical Engineering (PAEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PAEE.2016.7605115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

This paper presents a study of the GaN HEMT switching features conducted with the use of the half-bridge test converter rated at 2,5 kW. Results of simulation performed in LTSpice are verified by a series of experimental tests at the variable input voltage (up to 400 V) and switching frequency (up to 250 kHz). Three switch scenarios were analyzed: HEMT without the anti-parallel diode, HEMT with an anti-parallel SiC Schottky and HEMT with an additional parallel capacitor. Presented waveforms of drain-source voltage and drain current during switching processes and results of power losses measurements show significant reduction of switching power losses when anti-parallel diode or additional capacitor are applied. Furthermore, an impact of the dead-time length on power losses is also discussed and an optimal choice for assumed parameters of the converter is presented.
高频半桥变换器中GaN HEMT的工作模式
本文介绍了使用额定功率为2.5 kW的半桥测试变换器对GaN HEMT开关特性进行的研究。通过在可变输入电压(最高400 V)和开关频率(最高250 kHz)下的一系列实验测试,验证了LTSpice中进行的模拟结果。分析了三种开关方案:不带反并联二极管的HEMT、带反并联SiC肖特基的HEMT和带附加并联电容的HEMT。给出了开关过程中漏源极电压和漏极电流的波形和功率损耗测量结果,表明采用反并联二极管或附加电容可显著降低开关功率损耗。此外,还讨论了死区时间长度对功率损耗的影响,并给出了变换器假设参数的最优选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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