An investigation of the variation of leakage resistance of electrical insulating materials used on spacecraft power systems

G. A. Ford, C. Doreswamy, P. Bassapa
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Abstract

Spacecraft power systems are subjected to extremely hostile environments, due to the action of space plasma, temperature cycling and atomic oxygen. Literature indicates that the resistivity is sensitive to ambient temperature and pressure. The resistivity is an index which can indicate the performance of space based electrical systems. Hence, there is a need for experiments to determine the variation of leakage resistance with temperature and pressure. The surface leakage resistance, and volume resistance of Kapton H and V and Mylar films of 2 mils and 5 mils thickness were determined. The leakage resistance measurements were made according to ASTM D257. The experiments were conducted in a vacuum chamber with electrode temperatures ranging from 27/spl deg/ Centigrade to 140/spl deg/ Centigrade, and pressures varying from atmospheric to 10 millitorr at a voltage of 500 V.<>
航天器电力系统用电绝缘材料泄漏电阻变化规律的研究
由于空间等离子体、温度循环和原子氧的作用,航天器动力系统受到极端恶劣环境的影响。文献表明,电阻率对环境温度和压力很敏感。电阻率是反映天基电气系统性能的指标。因此,有必要通过实验来确定泄漏电阻随温度和压力的变化。测定了2 mils厚度的Kapton H、V膜和5 mils厚度的Mylar膜的表面泄漏电阻和体积电阻。根据ASTM D257进行泄漏电阻测量。实验在真空室中进行,电极温度范围为27 ~ 140/spl℃,压力范围为大气~ 10毫微,电压为500 V.>
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