Analysis of a power bipolar-mode JFET device by two-dimensional numerical simulation

P. Spirito, A. Strollo, A. Caruso
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引用次数: 3

Abstract

The on-state and off-state behavior of a bipolar mode JFET device is analyzed by using a detailed 2-D numerical simulation. The numerical results show that the device has basically two modes of operation, namely a unipolar mode of operation when the gate bias is less than 0.4 V and a bipolar mode of operation when gate voltage allows a significant injection of minority carrier into the channel. The analysis clearly shows the role played by the conductivity modulation in changing the shape of the I-V curve from the triode-like shape to the transistorlike one, as well as the influence of the most significant structure parameters on the electrical performance of the device. The transition between the unipolar mode of operation and the bipolar one is governed by the minority carrier concentration in the channel, and this transition is also responsible for the change in shape of the output I-V curves. All the relevant features of the I-V curves belonging to the unipolar and the bipolar regimes are observed and explained in the numerical analysis, in particular, the transition between the exponential and linear drain voltage dependence of the current in the unipolar operation and the very low on-resistance below the knee in the bipolar operation.<>
功率双极模JFET器件的二维数值模拟分析
采用二维数值模拟的方法分析了双极模式JFET器件的通、关态行为。数值结果表明,该器件基本上有两种工作模式,即当栅极偏置小于0.4 V时的单极工作模式和当栅极电压允许少量载流子大量注入通道时的双极工作模式。分析清楚地显示了电导率调制在改变I-V曲线形状从三极管形状到晶体管形状的过程中所起的作用,以及最重要的结构参数对器件电性能的影响。单极工作模式和双极工作模式之间的转变是由通道中少数载流子浓度决定的,这种转变也是输出I-V曲线形状变化的原因。在数值分析中,观察并解释了属于单极和双极的I-V曲线的所有相关特征,特别是单极操作中电流的指数和线性漏极电压依赖关系与双极操作中极低导通电阻膝盖以下之间的转变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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