Picosecond Excite-Probe and Transient Grating Studies of GaInAsP

R. Manning, A. Miller, A. M. Fox, J. Marsh
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Abstract

We have previously reported ultrafast saturation recovery in 0.860 eV (1.45 μm) bandgap GaxIn1–xAsyP1-y (x = 0.35, y = 0.78) [1], at high carrier densities (> l019 cm–3) using 5 psec pulses at 1.054 μm (1.176 eV). The extremely rapid (~ 10 psec) recovery was attributed to Auger recombination, and was consistent with values for the Auger coefficient measured by Sermage et al [2] at lower carrier densities, and subsequently by Wintner and Ippen [3]. Recently Islam et al [4] have carried out 2-pulse grating measurements on GaInAsP. This paper extends these studies to the 3-pulse transient grating technique with samples having different bandgap energies.
GaInAsP的皮秒激发探针和瞬态光栅研究
我们之前报道了在高载流子密度(> 1019 cm-3)下,使用5 psec的1.054 μm (1.176 eV)脉冲,在0.860 eV (1.45 μm)带隙GaxIn1-xAsyP1-y (x = 0.35, y = 0.78)[1]下的超快饱和恢复。极快(~ 10 psec)的恢复归因于俄歇复合,并且与Sermage等人在较低载子密度下测量的俄歇系数值一致,随后由Wintner和Ippen[3]测量。最近Islam等人对GaInAsP进行了双脉冲光栅测量。本文将这些研究扩展到具有不同带隙能量样品的三脉冲瞬态光栅技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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