A Comparative Study of CMOS Transimpedance Amplifier (TIA)

Priya Singh, Dr. Vandana Niranjan, Prof. Ashwni Kumar
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Abstract

In this paper a comparative study of different CMOS transimpedance amplifier has been presented. Standard device parameters of transimpedance amplifier such as gain, input refereed noise, power dissipation and group delay are studied and compared. Here the transimpedance amplifier is divided on the basis of its topology and device technology used and performance is summarized to get the overview. Most of the analysis taken are performed on 0.18 μm technology and some are implemented using 45nm, 0.13μm, 65nm, and 90nm.
CMOS跨阻放大器(TIA)的比较研究
本文对不同的CMOS跨阻放大器进行了比较研究。对跨阻放大器的增益、输入参考噪声、功耗和群延迟等标准器件参数进行了研究和比较。这里对跨阻放大器按其拓扑结构进行了划分,并对所采用的器件技术和性能进行了概述。大多数分析采用的是0.18 μm工艺,也有一些采用了45nm、0.13μm、65nm和90nm工艺。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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