Tungsten and tungsten carbide based contact materials used in low voltage vacuum contactors

Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343) Pub Date : 1900-01-01 DOI:10.1109/HOLM.1999.795934

V. Behrens, T. Honig, A. Kraus

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引用次数: 7

Abstract

By means of a single phase vacuum model switch with a current range from 50 A (for current chopping) to 1500 A (for AC4 contact erosion) contact materials of the group of tungsten carbide/silver, tungsten carbide/copper and tungsten/copper are evaluated. The properties focused on are current chopping in new state as well as during service life, contact erosion due to AC4 life due to cracking and reignition behavior. It is found that in regard to current chopping best results are obtained with WC/Ag and WC/Cu, while W/Cu and even an optimized W/Cu having antimony additives show substantially higher chopping currents. In regard to AC4 life and especially to reignitions the copper containing materials were found to be superior to the silver containing materials. In the case of WC/Cu there are indications of poor contact resistance during service life which is attributed to the evaporation of the copper from the arc treated area in combination with a poor wetting behavior of the molten copper to the WC particles.

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用于低压真空接触器的钨和碳化钨基接触材料

利用电流范围为50a(斩波电流)至1500a (AC4触点侵蚀)的单相真空模型开关，对碳化钨/银、碳化钨/铜和钨/铜三组触点材料进行了评价。重点研究了新状态下的电流切断以及在使用寿命期间，由于AC4寿命引起的接触侵蚀，以及由于开裂和重燃行为。在斩波电流方面，WC/Ag和WC/Cu的斩波效果最好，而添加了锑的W/Cu和优化后的W/Cu斩波电流要大得多。在AC4寿命方面，含铜材料优于含银材料，特别是在重燃方面。在WC/Cu的情况下，有迹象表明，在使用寿命期间，接触电阻很差，这是由于铜从电弧处理区域蒸发，再加上熔融铜对WC颗粒的润湿性差。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)

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