Design and Testing of a Broadband Microstrip Line-Empty SIW Transition for 5G Applications

Anil Kumar Nayak, Vinit Singh Yadav, A. Patnaik
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引用次数: 3

Abstract

This paper presents a new broadband transition between microstrip and empty substrate integrated waveguide (ESIW) over 23–29 GHz band. In the proposed work, the design is initially implemented to use SIW and combined with three layers of the substrate such as top, bottom, and middle. One side without a cladding conductor and the other side just a conductor are implemented for the top and bottom layers. Simultaneously, the middle layer is used as air instead of the lossy dielectric to limit the loss. In order to improve matching, two shorting pins are placed on two sides of the middle layer. It can be found that the shorting pin's diameter and position plays a crucial role in providing broadband impedance bandwidth and low overall losses. Laboratory prototype of the structure is experimentally measured to validate the claim and the theoretical results. This transition finds suitable application for 5G communications.
面向5G应用的宽带微带空线SIW过渡设计与测试
提出了一种在23-29 GHz频段上微带与空衬底集成波导(ESIW)之间的新型宽带过渡。在提出的工作中,设计初步实现了使用SIW,并结合了三层衬底,即顶层,底层和中层。一面没有覆层导体,另一面只有导体,用于顶层和底层。同时,中间层被用作空气而不是有损耗的介质来限制损耗。为了提高匹配性,在中间层的两侧放置两个短针。可以发现,短脚的直径和位置在提供宽带阻抗带宽和低总损耗方面起着至关重要的作用。对该结构的实验室样机进行了实验测量,以验证理论结果和理论主张。这种过渡为5G通信找到了合适的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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