{"title":"On experimental research of efficiency of tests construction for combinational circuits by the focused search method","authors":"V. Kulikov, V. V. Mokhor","doi":"10.1109/EWDTS.2011.6116588","DOIUrl":null,"url":null,"abstract":"Consider the possibility reducing the iteration value in building complete validation tests for digital devices. Building a test for a given fault is reduced to searching the terminal node in the signals assignment tree. The reducing is achieved by accumulating and using of information about dead-end conditions to avoid similar situations in the earlier stages. Allows any faults that can be described by logical functions.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 9th East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2011.6116588","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Consider the possibility reducing the iteration value in building complete validation tests for digital devices. Building a test for a given fault is reduced to searching the terminal node in the signals assignment tree. The reducing is achieved by accumulating and using of information about dead-end conditions to avoid similar situations in the earlier stages. Allows any faults that can be described by logical functions.