Design of a High-speed 8-bit Flash ADC using Double-Tail Comparator on 180nm CMOS Process

Hong-Hai Thai, C. Pham, Duc Hung Le
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Abstract

This paper presents a high-speed 8-bit Flash ADC. The design, which is considered as a mixed-signal type, includes two main blocks – comparator and encoder. The comparator block contains a TIQ comparator, a control circuit, and a proposed architecture of a Double-Tail (DT) comparator. The advantage of using the DT comparator is to reduce the half number of comparators which helps reduce the design area. The comparator is implemented with custom analog design meanwhile, the encoder block is designed with digital design flow. This mixed-signal circuit is designed and simulated on 180nm CMOS technology. The 8-bit Flash ADC only employs 128 comparators. The applied input clock for testing is 50 MHz with the input voltage ranging from 0.6V to 1.8V. Comparator block outputs 127 bits of thermometer code and sends them to the encoder, which exports 7 LSB bits of the binary code. The MSB bit is decided by only one DT comparator.
基于180nm CMOS工艺的双尾比较器高速8位Flash ADC设计
本文介绍了一种高速8位Flash ADC。该设计被认为是混合信号类型,包括两个主要模块-比较器和编码器。比较器模块包含TIQ比较器、控制电路和双尾(DT)比较器的拟议架构。使用DT比较器的优点是减少了一半的比较器数量,这有助于减少设计面积。比较器采用定制模拟设计实现,编码器模块采用数字化设计流程设计。在180nm CMOS工艺上设计并仿真了该混合信号电路。8位Flash ADC只使用128个比较器。用于测试的输入时钟为50 MHz,输入电压范围为0.6V至1.8V。比较器块输出127位温度计码并发送给编码器,编码器输出7 LSB位二进制码。MSB位仅由一个DT比较器决定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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