I. Budihardjo, P. Lauritzen, K. Wong, R. Darling, H. Mantooth
{"title":"Defining standard performance levels for power semiconductor devices","authors":"I. Budihardjo, P. Lauritzen, K. Wong, R. Darling, H. Mantooth","doi":"10.1109/IAS.1995.530423","DOIUrl":null,"url":null,"abstract":"Model validation for power semiconductor devices is classified into five levels with model performance features and applications defined for each level. The five levels for each device correspond to: basic, accurate, thermal, failure and degradation models. Whenever they exist, examples of device models are identified for each power semiconductor device.","PeriodicalId":117576,"journal":{"name":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.1995.530423","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22
Abstract
Model validation for power semiconductor devices is classified into five levels with model performance features and applications defined for each level. The five levels for each device correspond to: basic, accurate, thermal, failure and degradation models. Whenever they exist, examples of device models are identified for each power semiconductor device.