{"title":"Numerical simulation of coherent light diffracted from rough surfaces","authors":"T. Thurner, B. Brandstatter, G. Brasseur","doi":"10.1109/IMTC.2003.1208018","DOIUrl":null,"url":null,"abstract":"Laser speckle strain and displacement measurement is a well established method for noncontacting sensing in material science applications. This paper deals with a simulation of the forming of laser speckles for free field propagation of the diffracted light-wave-field whose intensity distribution on the observation plane is the objective speckle pattern. A need for simulation of laser speckles is the analysis of accuracy and sensitivity of different measurement set-ups as well as the analysis of decorrelation effects due to structural changes on the specimen's surface, known and unknown object translation and rotation and changes in the illumination conditions.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Laser speckle strain and displacement measurement is a well established method for noncontacting sensing in material science applications. This paper deals with a simulation of the forming of laser speckles for free field propagation of the diffracted light-wave-field whose intensity distribution on the observation plane is the objective speckle pattern. A need for simulation of laser speckles is the analysis of accuracy and sensitivity of different measurement set-ups as well as the analysis of decorrelation effects due to structural changes on the specimen's surface, known and unknown object translation and rotation and changes in the illumination conditions.