D. Troupis, S. Manesis, N. Koussoulas, T. Chronopoulos
{"title":"Computer integrated monitoring, fault identification and control for a bottling line","authors":"D. Troupis, S. Manesis, N. Koussoulas, T. Chronopoulos","doi":"10.1109/IAS.1995.530488","DOIUrl":null,"url":null,"abstract":"Today's bottling lines are complex production systems encountered in many kinds of food industries. Without an efficient monitoring system, such lines can prove to be inflexible and hard to manage. This paper presents the main issues which emerged during the conversion of a typical bottling line to a flexible and reconfigurable system, capable of implementing on-line decisions. Real-time monitoring, computer integrated structure, industrial networking, fault identification and modeling of fault propagation are the major themes covered.","PeriodicalId":117576,"journal":{"name":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","volume":"315 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.1995.530488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Today's bottling lines are complex production systems encountered in many kinds of food industries. Without an efficient monitoring system, such lines can prove to be inflexible and hard to manage. This paper presents the main issues which emerged during the conversion of a typical bottling line to a flexible and reconfigurable system, capable of implementing on-line decisions. Real-time monitoring, computer integrated structure, industrial networking, fault identification and modeling of fault propagation are the major themes covered.