Lei Ma, Cyrille Artho, Cheng Zhang, Hiroyuki Sato, M. Hagiya, Yoshinori Tanabe, M. Yamamoto
{"title":"GRT at the SBST 2015 Tool Competition","authors":"Lei Ma, Cyrille Artho, Cheng Zhang, Hiroyuki Sato, M. Hagiya, Yoshinori Tanabe, M. Yamamoto","doi":"10.1109/SBST.2015.19","DOIUrl":null,"url":null,"abstract":"GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.","PeriodicalId":219232,"journal":{"name":"2015 IEEE/ACM 8th International Workshop on Search-Based Software Testing","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE/ACM 8th International Workshop on Search-Based Software Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBST.2015.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
GRT (Guided Random Testing) is an automatic test generation tool for Java code, which leverages static and dynamic program analysis to guide run-time test generation. In this paper, we summarize competition results and experiences of GRT in participating in SBST 2015, where GRT ranked first with a score of 203.73 points over 63 Java classes from 10 packages of 9 open-source software projects.