{"title":"Design of dual-band balun with tapped stubs","authors":"Hualiang Zhang, Yitian Peng, H. Xin","doi":"10.1109/RWS.2008.4463628","DOIUrl":null,"url":null,"abstract":"This paper presents a new type of stub tapped balun for dual-band applications. In the design, a tapped stub is used to realize 90deg phase shift at two frequencies, resulting in a dual-band quarter-wavelength transmission line. The dual-band line, as an impedance transformer, is then implemented into a branch-line balun for dual-band operations. Explicit design equations for the new balun are derived using the ABCD-matrix and even-odd mode method. To verify the design concept, a microstrip balun operating at 2.45/5.25 GHz is fabricated on printed circuit board. Measurement results match well the theoretical predictions.","PeriodicalId":431471,"journal":{"name":"2008 IEEE Radio and Wireless Symposium","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Radio and Wireless Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RWS.2008.4463628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a new type of stub tapped balun for dual-band applications. In the design, a tapped stub is used to realize 90deg phase shift at two frequencies, resulting in a dual-band quarter-wavelength transmission line. The dual-band line, as an impedance transformer, is then implemented into a branch-line balun for dual-band operations. Explicit design equations for the new balun are derived using the ABCD-matrix and even-odd mode method. To verify the design concept, a microstrip balun operating at 2.45/5.25 GHz is fabricated on printed circuit board. Measurement results match well the theoretical predictions.