{"title":"Performance evaluation of fault-tolerance operation of three-phase voltage source rectifier with predictive control","authors":"Xing Liu, F. Yu, Xu Zhang, Wen‐Long Huang","doi":"10.1109/ICIEA.2018.8398114","DOIUrl":null,"url":null,"abstract":"Three phase voltage source rectifiers (VSRs) have been widely utilized to realize AC-DC power conversion over the past decades. Nevertheless, VSR switch devices such as Insulated Gate Bipolar Transistors (IGBTs) and Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFETs) are prone to fault, as a result of thermal dissipation problem. In order to solve this issue, a fault-tolerant three-phase VSR topology is proposed to deal with the open-circuit faults in this paper. The topology of the proposed VSR is a six-switch three-phase VSR (SSTP-VSR) under common operation and will be reconstructed into a four-switch three-phase VSR (FSTP-VSRs) for post-fault operation. In addition, a finite control set model predictive control (FCS-MPC) strategy is addressed to handle the unbalance of the dc-link capacitor voltages. Simulation results are conducted to verify the validity of the proposed control strategy.","PeriodicalId":140420,"journal":{"name":"2018 13th IEEE Conference on Industrial Electronics and Applications (ICIEA)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th IEEE Conference on Industrial Electronics and Applications (ICIEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIEA.2018.8398114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Three phase voltage source rectifiers (VSRs) have been widely utilized to realize AC-DC power conversion over the past decades. Nevertheless, VSR switch devices such as Insulated Gate Bipolar Transistors (IGBTs) and Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFETs) are prone to fault, as a result of thermal dissipation problem. In order to solve this issue, a fault-tolerant three-phase VSR topology is proposed to deal with the open-circuit faults in this paper. The topology of the proposed VSR is a six-switch three-phase VSR (SSTP-VSR) under common operation and will be reconstructed into a four-switch three-phase VSR (FSTP-VSRs) for post-fault operation. In addition, a finite control set model predictive control (FCS-MPC) strategy is addressed to handle the unbalance of the dc-link capacitor voltages. Simulation results are conducted to verify the validity of the proposed control strategy.