Jian Liu, Lijie Zhang, Xin Wang, Lin Lin, Zitao Shi, Albert Z. H. Wang, Ru Huang, Gary Zhang, Shi-Jie Wen, R. Wong
{"title":"Nano crossbar electrostatic discharge protection design","authors":"Jian Liu, Lijie Zhang, Xin Wang, Lin Lin, Zitao Shi, Albert Z. H. Wang, Ru Huang, Gary Zhang, Shi-Jie Wen, R. Wong","doi":"10.1109/RFIC.2011.5940627","DOIUrl":null,"url":null,"abstract":"We report design and analysis of new nano crossbar based nano phase switching electrostatic discharge (ESD) protection structures. Measurements confirm ESD protection featuring fast response of 100pS, ultra low leakage I<inf>leak</inf>∼0.11pA, varying trigger voltage (V<inf>t1</inf>) and good ESD protection voltage ratio (ESDV)>230V/µm<sup>2</sup>. This non-traditional nano-crossbar ESD protection can be a potential solution for RF and mixed-signal ICs.","PeriodicalId":448165,"journal":{"name":"2011 IEEE Radio Frequency Integrated Circuits Symposium","volume":"601 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE Radio Frequency Integrated Circuits Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2011.5940627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We report design and analysis of new nano crossbar based nano phase switching electrostatic discharge (ESD) protection structures. Measurements confirm ESD protection featuring fast response of 100pS, ultra low leakage Ileak∼0.11pA, varying trigger voltage (Vt1) and good ESD protection voltage ratio (ESDV)>230V/µm2. This non-traditional nano-crossbar ESD protection can be a potential solution for RF and mixed-signal ICs.