HTS film characterization using combined microstrip resonator

Abstract

An original variant of high-temperature superconductor (HTS) film impedance determination using combined microstrip resonator (MSR) is presented. The significant advantage of the method is a possibility of HTS film properties investigation in applied external magnetic field. The general review of HTS film impedance determination has been made. The theoretical analysis of combined MSR has been carried out using Bubnov - Galerkin - Ritz method (modified momentum method) and the geometry factor of combined MSR has been estimated. The method application for the HTS film properties investigation in an applied external magnetic field is illustrated.