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The RFID Electronic Tag Defect Detection System Based On YOLOv5 For Industrial Scenarios

Proceedings of International Exchange and Innovation Conference on Engineering & Sciences (IEICES) Pub Date : 2022-10-20 DOI:10.5109/5909061
Jing Zhou, Zhaodong Ding, Guanghui Du, Shuangshuang Zhao, T. Furukawa, Ke Lu
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基于YOLOv5的工业场景RFID电子标签缺陷检测系统
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Proceedings of International Exchange and Innovation Conference on Engineering & Sciences (IEICES)
Proceedings of International Exchange and Innovation Conference on Engineering & Sciences (IEICES)
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