{"title":"Production control implications for CIMS","authors":"S. Sarin, S.K. Das","doi":"10.1109/CIM.1988.5428","DOIUrl":null,"url":null,"abstract":"The implications and importance of production control for CIM (computer-integrated manufacturing) are discussed. To better understand what these implications are, a list of twenty desirable attributes of computer integrated production planning and control (CIPP&C) systems are presented. The list is neither exhaustive nor mandatory. It is in a sense a wish list and it is unlikely that any one system will incorporate all the features. But, it is important that the development of the features be approached in an attempt to integrate them in CIPP&C systems. A brief review of current methodologies incorporating some of these attributes is reported.<<ETX>>","PeriodicalId":334994,"journal":{"name":"[Proceedings] 1988 International Conference on Computer Integrated Manufacturing","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1988 International Conference on Computer Integrated Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIM.1988.5428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The implications and importance of production control for CIM (computer-integrated manufacturing) are discussed. To better understand what these implications are, a list of twenty desirable attributes of computer integrated production planning and control (CIPP&C) systems are presented. The list is neither exhaustive nor mandatory. It is in a sense a wish list and it is unlikely that any one system will incorporate all the features. But, it is important that the development of the features be approached in an attempt to integrate them in CIPP&C systems. A brief review of current methodologies incorporating some of these attributes is reported.<>