Effect of device, size, activation energy, temperature, and frequency on memristor switching time

Heba Abunahla, B. Mohammad, D. Homouz
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引用次数: 10

Abstract

Memristor has a potential to play a big role in the electronics industry as it provides small size, low cost and low power. However, the asymmetry between the ON and OFF switching times of the device hinders the adaption of the device in modern electronics systems. The contribution of this paper is to explore the relationship between the length of the memristor and the switching times. To achieve this the nonlinear model of oxygen vacancies is used. The model also includes coupling with electron transfer. The study shows that tuning the device length can affect the switching time significantly. This paper shows that having a device length of 10-nm gives switching ON and OFF times in the range of 4s - 13ns for applied voltage of 1V - 2.3V. In additon, the obtained OFF/ON switching time ratio is 3x compared to several order of magnitudes reported inliterature for device length of 50-nm. The proposed model is also used to study the effect of changing temperature, activation energy and frequency on memristor switching time.
器件、尺寸、激活能、温度和频率对忆阻器开关时间的影响
忆阻器具有体积小、成本低、功耗低等特点,在电子工业中具有重要的应用前景。然而,器件的ON和OFF开关时间之间的不对称阻碍了器件在现代电子系统中的适应。本文的贡献在于探讨了忆阻器长度与开关时间之间的关系。为此,采用了非线性氧空位模型。该模型还包括耦合与电子转移。研究表明,调整器件长度可以显著影响开关时间。本文表明,当器件长度为10nm时,在施加电压为1V - 2.3V时,开关时间在4s - 13ns之间。此外,与文献中报道的器件长度为50 nm时的几个数量级相比,获得的OFF/ON开关时间比是3倍。该模型还用于研究温度、激活能和频率变化对忆阻器开关时间的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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