Low-Overhead Run-Time Memory Leak Detection and Recovery

Timothy Tsai, K. Vaidyanathan, K. Gross
{"title":"Low-Overhead Run-Time Memory Leak Detection and Recovery","authors":"Timothy Tsai, K. Vaidyanathan, K. Gross","doi":"10.1109/PRDC.2006.42","DOIUrl":null,"url":null,"abstract":"Memory leaks are known to be a major cause of reliability and performance issues in software. This paper describes a run-time scheme that detects and removes memory leaks with minimal performance overhead and with no modifications to application source code. The scheme consists of a first stage where a pattern recognition technique proactively detects subtle memory leaks, followed by a more resource-intensive second stage that scans the memory space of an application and removes detected memory leaks. The pattern recognition technique in the first stage is based on the multivariate state estimation technique (MSET) which provides accurate detection of subtle memory leaks with very little overhead. The second stage is only activated when problems are identified by the first stage. For our prototype, this second stage is based on debugging and analysis tools provided by Solaris 10. Due to the low-overhead impact of the first stage, the system can be monitored for memory leaks without incurring noticeable performance degradation. We present and discuss some results from our unique proactive detection and debugging methodology","PeriodicalId":314915,"journal":{"name":"2006 12th Pacific Rim International Symposium on Dependable Computing (PRDC'06)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 12th Pacific Rim International Symposium on Dependable Computing (PRDC'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PRDC.2006.42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

Memory leaks are known to be a major cause of reliability and performance issues in software. This paper describes a run-time scheme that detects and removes memory leaks with minimal performance overhead and with no modifications to application source code. The scheme consists of a first stage where a pattern recognition technique proactively detects subtle memory leaks, followed by a more resource-intensive second stage that scans the memory space of an application and removes detected memory leaks. The pattern recognition technique in the first stage is based on the multivariate state estimation technique (MSET) which provides accurate detection of subtle memory leaks with very little overhead. The second stage is only activated when problems are identified by the first stage. For our prototype, this second stage is based on debugging and analysis tools provided by Solaris 10. Due to the low-overhead impact of the first stage, the system can be monitored for memory leaks without incurring noticeable performance degradation. We present and discuss some results from our unique proactive detection and debugging methodology
低开销运行时内存泄漏检测和恢复
众所周知,内存泄漏是导致软件可靠性和性能问题的主要原因。本文描述了一种运行时方案,该方案以最小的性能开销和不修改应用程序源代码的情况下检测和删除内存泄漏。该方案包括第一阶段,其中模式识别技术主动检测细微的内存泄漏,然后是资源更密集的第二阶段,扫描应用程序的内存空间并删除检测到的内存泄漏。第一阶段的模式识别技术是基于多变量状态估计技术(MSET)的,该技术可以在很小的开销下精确检测细微的内存泄漏。只有在第一阶段发现问题时才会激活第二阶段。对于我们的原型,第二阶段是基于Solaris 10提供的调试和分析工具。由于第一阶段的低开销影响,可以监视系统的内存泄漏,而不会引起明显的性能下降。我们介绍并讨论了我们独特的主动检测和调试方法的一些结果
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