{"title":"Simulation of the single-electron transistors based on different materials","authors":"I. I. Abramov, E. Novik","doi":"10.1109/CRMICO.1999.815242","DOIUrl":null,"url":null,"abstract":"The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.","PeriodicalId":326430,"journal":{"name":"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 9th International Crimean Microwave Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.99EX363)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.1999.815242","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The theoretical investigation of the constructive-technological and electrophysical parameters influencing the single-electron transistor characteristics (temperature of operation, frequency limit, current-voltage characteristic) is carried out. The single-electron device simulator SET-NANODEV was used for the investigations. The single-electron transistors based on different metals were considered. Behavior of the single-electron transistor characteristics depending on material and construction parameters was determined.