{"title":"A web-based graduate course on design-for-reliability of electronic systems","authors":"P. Mccluskey","doi":"10.1109/ECTC.2002.1008306","DOIUrl":null,"url":null,"abstract":"Today's product developers operate in a world of shortened design cycles in which quick time-to-market is essential. In such an environment, the luxury of improving reliability through multiple prototyping is a thing of the past. No longer is it possible to make a prototype, subject it to a series of standardized tests, analyze the failures, fix the design, and test again. Instead, new methods of reliability improvement have been developed that consider reliability up-front in the design cycle. Now the design can be analyzed and fixed before the first prototype is made. This new method of designing for reliability, however, requires a fundamental understanding of the chemical, electrical, mechanical, and thermo-mechanical mechanisms that cause failure of electronics.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008306","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Today's product developers operate in a world of shortened design cycles in which quick time-to-market is essential. In such an environment, the luxury of improving reliability through multiple prototyping is a thing of the past. No longer is it possible to make a prototype, subject it to a series of standardized tests, analyze the failures, fix the design, and test again. Instead, new methods of reliability improvement have been developed that consider reliability up-front in the design cycle. Now the design can be analyzed and fixed before the first prototype is made. This new method of designing for reliability, however, requires a fundamental understanding of the chemical, electrical, mechanical, and thermo-mechanical mechanisms that cause failure of electronics.