"Extracting the Required Reflection to Compensate the Sealed Connector of a Microstrip Fixture"

Abstract

The microstrip test fixture with sealed connectors was tested and converted to the time domain to reveal the reflections at each connector. The MAMA program was used to make the measurements using the new hp8510c analyzer and the PC-486 controller. This is an experimental micro strip line in an empty box housing. A capacitive demonstration file was then used to modify the connectors by "injecting" into the experiment a capacitive reflection. The results gave the same result as if an actual capacitance had been added to the test fixture connector.