C. Young, R. Rodriguez-Davila, P. Bolshakov, R. Chapman, M. Quevedo-López
{"title":"Reliability Assessment of Low-Temperature ZnO-Based Thin-Film Transistors","authors":"C. Young, R. Rodriguez-Davila, P. Bolshakov, R. Chapman, M. Quevedo-López","doi":"10.1201/b22262-16","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":260764,"journal":{"name":"Handbook of Flexible and Stretchable Electronics","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Handbook of Flexible and Stretchable Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/b22262-16","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
