{"title":"Recent developments in reduced order modeling based on mode superposition technique","authors":"V. Kolchuzhin, M. Naumann, J. Mehner","doi":"10.1109/ESIME.2011.5765826","DOIUrl":null,"url":null,"abstract":"The paper is focused on advanced reduced order modeling (ROM) methods for MEMS using mode superposition technique and finite element solvers for data extraction for the governing equations. Dynamically accurate behavior representations can be achieved for microstructures with flexible components and their most important interactions with thermal, electrostatic and fluid fields. Results are macromodel based on analytical terms which can be transferred to electronic and system simulators for virtual prototyping and device analyses.","PeriodicalId":115489,"journal":{"name":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2011.5765826","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The paper is focused on advanced reduced order modeling (ROM) methods for MEMS using mode superposition technique and finite element solvers for data extraction for the governing equations. Dynamically accurate behavior representations can be achieved for microstructures with flexible components and their most important interactions with thermal, electrostatic and fluid fields. Results are macromodel based on analytical terms which can be transferred to electronic and system simulators for virtual prototyping and device analyses.