PCM compact model: Optimized methodology for model card extraction

Abstract

To achieve high yield on product embedding PCM memory, it is mandatory to provide to designers accurately calibrated PCM compact model. To achieve this goal, it is mandatory to develop standardized model card extraction methodology. In this paper, we present a PCM model card extraction flow based on a minimal set of static and dynamic measurements. Based on this measurement, characteristics are first obtained and model card parameters extracted without any loop back, i.e. each parameter is extracted only once on a given characteristic. After this extraction procedure, model card values are validated through a comparison with an extra characteristics SET-Low characteristic not used for the extraction.