Investigation of the Electrode Materials in Conductive Bridging RAM from First-Principle

F. Ducry, K. Portner, S. Andermatt, M. Luisier
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Abstract

Conductive bridging random access memories (CBRAM) are emerging non-volatile data storage devices whose switching mechanisms are not fully understood. Here, we present a modelling framework based on ab-initio simulations to investigate CBRAM cells. It combines density-functional theory and the Non-equilibrium Greens Function formalism. Realistic metallic filaments connecting two electrodes are constructed and their ballistic transport characteristics studied. For a given filament the type of counter electrode material has little influence on the magnitude of the ON-state current, but affects its spatial distribution. The conductance mainly depends on the material of the active electrode and the shape of the thinnest part of the filament.
从第一性原理研究导电桥接存储器中电极材料
导电桥接随机存取存储器(CBRAM)是新兴的非易失性数据存储器件,其开关机制尚未完全了解。在这里,我们提出了一个基于ab-initio模拟的建模框架来研究CBRAM细胞。它结合了密度泛函理论和非平衡格林函数形式主义。构造了连接两个电极的真实金属丝,并研究了其弹道输运特性。对于给定的灯丝,对电极材料的类型对导通电流的大小影响不大,但会影响其空间分布。电导主要取决于活性电极的材料和灯丝最薄部分的形状。
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