D. Rabijns, G. Vandersteen, W. van Moer, Y. Rolain, J. Schoukens
{"title":"Creating spectrally pure signals for adc-testing","authors":"D. Rabijns, G. Vandersteen, W. van Moer, Y. Rolain, J. Schoukens","doi":"10.1109/IMTC.2003.1208230","DOIUrl":null,"url":null,"abstract":"Abslracl For accurate testing of analog-to-digital converters (ADC), the spectral purity of the input signal is utterly important. This paper describes a method to create very pure signals, such as sine waves, dual-tones or multi-tones, using only power measurements. The signals are generated with an arbitrary waveform generator (AWG). Any unwanted spectral line is removed, independent of its exact origin. This allows to apply the correct signal to the ADC under test, even if the signal source is not perfect or is followed by filters or amplifiers with a small non-linear distortion. Measurements are used to demonstrate the capabilities of the method.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
Abslracl For accurate testing of analog-to-digital converters (ADC), the spectral purity of the input signal is utterly important. This paper describes a method to create very pure signals, such as sine waves, dual-tones or multi-tones, using only power measurements. The signals are generated with an arbitrary waveform generator (AWG). Any unwanted spectral line is removed, independent of its exact origin. This allows to apply the correct signal to the ADC under test, even if the signal source is not perfect or is followed by filters or amplifiers with a small non-linear distortion. Measurements are used to demonstrate the capabilities of the method.