Zuow-Zun Chen, Yen-Hsiang Wang, Jaewook Shin, Yan Zhao, S. A. Mirhaj, Yen-Cheng Kuan, H. Chen, C. Jou, M. Tsai, F. Hsueh, Mau-Chung Frank Chang
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引用次数: 42
Abstract
The noise performance of an all-digital phase-locked loop (ADPLL) is limited by the resolution of the time-to-digital converter (TDC). Most TDC research in the past focused on the arrival time difference between the edges of the divider feedback and the reference signal [1-2]. This results in coarser TDC resolution and worse ADPLL noise performance. This paper presents a fractional-/VADPLL that employs a new time-to-digital conversion technique based on sub-sampling phase detection. It is accomplished by directly sampling the analog voltage signal at the PLL's high frequency node and converting it into a digital code. This achieves a higher time resolution with less power.