{"title":"The research on electronic equipment's testability integrated demonstration","authors":"Y. Yin, Shang Chaoxuan, Yanheng Ma, Li Gang","doi":"10.1109/PHM.2012.6228792","DOIUrl":null,"url":null,"abstract":"Methods of testability demonstration in electronic equipments are: inherent testability analysis, experimental demonstration and simulated demonstration. Each of these methods yield different aspects of the level of equipment's testability, but the result is isolated and there are no connections with each method. In order to overcome this weakness, this paper combines many aspects of testability to achieve a full-scale and objective result to increase confidence.","PeriodicalId":444815,"journal":{"name":"Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHM.2012.6228792","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Methods of testability demonstration in electronic equipments are: inherent testability analysis, experimental demonstration and simulated demonstration. Each of these methods yield different aspects of the level of equipment's testability, but the result is isolated and there are no connections with each method. In order to overcome this weakness, this paper combines many aspects of testability to achieve a full-scale and objective result to increase confidence.