{"title":"Crop management: Wheat yield prediction and disease detection using an intelligent predictive algorithms and metrological parameters","authors":"Nandini Babbar, Ashish Kumar, V. Verma","doi":"10.1016/b978-0-323-85214-2.00006-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":234118,"journal":{"name":"Deep Learning for Sustainable Agriculture","volume":"43 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Deep Learning for Sustainable Agriculture","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/b978-0-323-85214-2.00006-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}