In-Situ TID Testing and Characterization of a Highly Integrated RF Agile Transceiver for Multi-Band Radio Applications in a Radiation Environment

Abstract

In this paper, the in-situ testing and characterization of an highly integrated radio frequency (RF) agile transceiver in an radiation environment is presented. The device under test (DUT) is exposed by γ-rays to evaluate the total ionizing dose effects. The advance in-situ test setup allows detailed analysis of the DUT’s RF performance. The test procedures and methods are described and particular test results are shown. The DUT has been irradiated to a total ionizing dose of ~190krad and has not shown any conspicuous degradation effects or malfunctions.