H. Nakano, J. Ito, H. Furuhashi, A. Maeda, T. Yoshikawa, Y. Uchida, K. Kojima, A. Ohashi, S. Ochiai, T. Mizutani
{"title":"Nonlinear optical properties and morphologies of VOPc thin film prepared on polyimide film","authors":"H. Nakano, J. Ito, H. Furuhashi, A. Maeda, T. Yoshikawa, Y. Uchida, K. Kojima, A. Ohashi, S. Ochiai, T. Mizutani","doi":"10.1109/LEOSST.2000.869740","DOIUrl":null,"url":null,"abstract":"If the third harmonic phase matching condition of a nonlinear optical material is satisfied, the efficiency of third harmonic wave is improved, and the TH strength increases in proportion to the square of the film thickness. The phase matching condition was examined from the relation of the TH strength vs. the film thickness. The UV/VIS spectra of the film is studied.","PeriodicalId":415720,"journal":{"name":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2000.869740","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
If the third harmonic phase matching condition of a nonlinear optical material is satisfied, the efficiency of third harmonic wave is improved, and the TH strength increases in proportion to the square of the film thickness. The phase matching condition was examined from the relation of the TH strength vs. the film thickness. The UV/VIS spectra of the film is studied.