SRAM cell with improved stability and reduced leakage current for subthreshold region of operation

P. Sreelakshmi, Kirti S. Pande, N. S. Murty
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引用次数: 13

Abstract

In this paper, a Modified Differential 8T SRAM cell is proposed for subthreshold region of operation. Forward Body biasing technique is used to improve the drivability of transistors and sleep transistor logic is used to reduce the leakage current in standby mode. The proposed design is implemented with 45 nm CMOS technology and is simulated using Cadence Virtuoso Simulator. At 0.5 V supply voltage, the read SNM and write SNM are 98 mV and 112 mV respectively and these are 32% and 21% higher than there reported in literature. The leakage current and power consumption of the cell are 3.26 fA and 1.63 fW respectively.
SRAM电池与改进的稳定性和减少泄漏电流的亚阈值区域的操作
本文提出了一种改进的差分8T SRAM单元,用于阈下区域的工作。采用正向体偏置技术提高晶体管的可驱动性,采用休眠晶体管逻辑降低待机状态下的漏电流。该设计采用45纳米CMOS技术实现,并使用Cadence Virtuoso模拟器进行仿真。在0.5 V电源电压下,读SNM和写SNM分别为98 mV和112 mV,比文献报道的高32%和21%。电池的漏电流为3.26 fA,功耗为1.63 fW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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