{"title":"Use software reliability growth models wisely","authors":"Yuan Wei","doi":"10.1109/ISSREW.2013.6688903","DOIUrl":null,"url":null,"abstract":"Presents a collection of slides covering the following topics: what are SRGMs and what can they do; general SRGM process; current situations for SRGMs; assumptions and easy-made mistakes in SRGMs; and applications of SRGM.","PeriodicalId":332420,"journal":{"name":"2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSREW.2013.6688903","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Presents a collection of slides covering the following topics: what are SRGMs and what can they do; general SRGM process; current situations for SRGMs; assumptions and easy-made mistakes in SRGMs; and applications of SRGM.