Image Acquisition for High Accuracy Interferometry

G. Campbell, G. Sommargren, B. Truax
{"title":"Image Acquisition for High Accuracy Interferometry","authors":"G. Campbell, G. Sommargren, B. Truax","doi":"10.1364/oft.1998.owc.2","DOIUrl":null,"url":null,"abstract":"In phase shifting interferometry, the image acquisition electronics have largely been ignored, because the overall measurement accuracy has generally been limited by the quality of the reference wave. A recently developed interferometer, the phase shifting diffraction interferometer,[1] provides a high quality reference wave, which has been measured to be better than λ/8000 rms. With such a reference wave, the interferometer accuracy then becomes limited by systematic errors in the image acquisition electronics. This paper presents a variety of issues that arise when using image acquisition electronics of the sort commonly used in commercial interferometers. A basic fiber interferometer that isolates electronics issues is described, as are simple solutions to some of the errors.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"578 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1998.owc.2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In phase shifting interferometry, the image acquisition electronics have largely been ignored, because the overall measurement accuracy has generally been limited by the quality of the reference wave. A recently developed interferometer, the phase shifting diffraction interferometer,[1] provides a high quality reference wave, which has been measured to be better than λ/8000 rms. With such a reference wave, the interferometer accuracy then becomes limited by systematic errors in the image acquisition electronics. This paper presents a variety of issues that arise when using image acquisition electronics of the sort commonly used in commercial interferometers. A basic fiber interferometer that isolates electronics issues is described, as are simple solutions to some of the errors.
高精度干涉测量的图像采集
在相移干涉测量中,由于整体测量精度通常受到参考波质量的限制,图像采集电子在很大程度上被忽略了。最近开发的一种干涉仪,相移衍射干涉仪[1]提供了高质量的参考波,测量结果优于λ/8000 rms。有了这样一个参考波,干涉仪的精度就会受到图像采集电子系统误差的限制。本文介绍了在使用商业干涉仪中常用的那种图像采集电子器件时出现的各种问题。描述了一种隔离电子问题的基本光纤干涉仪,以及一些误差的简单解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信