{"title":"Instruments for Optical Measurements","authors":"Haiyi Sun","doi":"10.1117/3.2504404.CH11","DOIUrl":null,"url":null,"abstract":"Optical measurements partially overlap laser beam characterization, so some of the instruments introduced in this chapter can also be used to characterize laser beams. For example, Shack–Hartmann wavefront sensors can be used to characterize laser beam wavefronts. Scanning Fabry–Perot interferometers can be used to analyze the laser beam spectrum.","PeriodicalId":244831,"journal":{"name":"Basic Optical Engineering for Engineers and Scientists","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Basic Optical Engineering for Engineers and Scientists","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/3.2504404.CH11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Optical measurements partially overlap laser beam characterization, so some of the instruments introduced in this chapter can also be used to characterize laser beams. For example, Shack–Hartmann wavefront sensors can be used to characterize laser beam wavefronts. Scanning Fabry–Perot interferometers can be used to analyze the laser beam spectrum.