{"title":"Use of AI for Fault Identification in the E & P Life Cycle","authors":"M. Ackers, S. Berg, M. Taylor","doi":"10.3997/2214-4609.202210797","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":223218,"journal":{"name":"83rd EAGE Annual Conference & Exhibition","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"83rd EAGE Annual Conference & Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3997/2214-4609.202210797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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