On the parallel programming of flash memory cells

Eitan Yaakobi, Anxiao Jiang, P. Siegel, A. Vardy, J. Wolf
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引用次数: 8

Abstract

Parallel programming is an important tool used in flash memories to achieve high write speed. In parallel programming, a common programm voltage is applied to many cells for simultaneous charge injection. This property significantly simplifies the complexity of the memory hardware, and is a constraint that limits the storage capacity of flash memories. Another important property is that cells have different hardness for charge injection. It makes the charge injected into cells differ even when the same program voltage is applied to them. In this paper, we study the parallel programming of flash memory cells, focusing on the above two properties. We present algorithms for parallel programming when there is information on the cells' hardness for charge injection, but there is no feedback information on cell levels during programming. We then proceed to the programming model with feedback information on cell levels, and study how well the information on the cells' hardness for charge injection can be obtained. The results can be useful for understanding the storage capacity of flash memories with parallel programming.
快闪存储单元并行编程研究
并行编程是闪存实现高写入速度的重要工具。在并行编程中,一个共同的程序电压被施加到许多电池上以同时注入电荷。这一特性大大简化了存储硬件的复杂性,并且是限制闪存存储容量的约束。另一个重要的特性是电池具有不同的硬度,以用于电荷注入。即使施加相同的程序电压,它也会使注入电池的电荷不同。本文主要研究了闪存单元的并行编程,重点研究了这两个特性。我们提出了一种并行编程算法,当有关于细胞的硬度信息用于电荷注入,但在编程过程中没有关于细胞水平的反馈信息。然后,我们继续进行具有细胞水平反馈信息的编程模型,并研究如何很好地获得细胞硬度信息以进行电荷注入。研究结果可用于理解并行编程的闪存存储容量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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