Characterization of ASIC performance via application specific test engineering

Third Annual IEEE Proceedings on ASIC Seminar and Exhibit Pub Date : 1990-09-17 DOI:10.1109/ASIC.1990.186179

R. Chrusciel

引用次数: 1

Abstract

Some of the benefits of customer- and application-specific characterization of ASICs are discussed. The author discusses why ASIC device performance is characterized. An example of characterization data is presented for a CMOS gate array. The benefits of having this data are given. A cost analysis of using contract test engineering services to provide this data is presented.<>

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通过特定应用测试工程对ASIC性能进行表征

讨论了针对客户和特定应用的asic特性的一些好处。作者讨论了ASIC器件性能特征的原因。给出了CMOS门阵列表征数据的一个例子。给出了拥有这些数据的好处。提出了使用合同测试工程服务来提供这些数据的成本分析

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Third Annual IEEE Proceedings on ASIC Seminar and Exhibit

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