{"title":"A new bridging fault model for more accurate fault behavior","authors":"J. Emmert, C. Stroud, J. Bailey","doi":"10.1109/AUTEST.2000.885628","DOIUrl":null,"url":null,"abstract":"We describe a new bridging fault model which more accurately simulates the behavior of bridging faults that have been observed as a result of manufacturing fabrication defects in tightly packed logic structures.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"279 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
We describe a new bridging fault model which more accurately simulates the behavior of bridging faults that have been observed as a result of manufacturing fabrication defects in tightly packed logic structures.