All injection level transmission line model of minority-carrier transport

T. Pesic, J. Karamarković, N. Jankovic
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引用次数: 0

Abstract

The method of modeling all injection level minority carrier transport in the arbitrarily doped base quasi-neutral region of bipolar transistors by the equivalent inhomogeneous lossy transmission line (TL) is summarized. Contrary to presently available all injection level collector current models, our TL method is more general since it includes both the Webster and Kirk effects. It was found that the Kirk effect significantly influences base minority-carrier transport in the medium- as well as high-level injection region, and by no means can be neglected in modeling high-injection effects. The accuracy of the TL model is accessed by comparing collector currents calculated by the TL model with those obtained by a standard ID numerical simulator (SEDAN) and by experimental data.
少数载流子输送的全注入级传输线模型
总结了用等效非均匀损耗传输线(TL)模拟双极晶体管任意掺杂基极准中性区全注入能级少数载流子输运的方法。与目前可用的所有注入水平收集器当前模型相反,我们的TL方法更通用,因为它包括韦伯斯特和柯克效应。研究发现,柯克效应对中、高注入区基态少数载流子输运有显著影响,在模拟高注入效应时不可忽视。通过将TL模型计算的集电极电流与标准ID数值模拟器(SEDAN)计算的集电极电流和实验数据进行比较,验证了TL模型的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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