R. Anholt, C. Bozada, G. Desalvo, R. Dettmer, J. Ebel, J. Gillespie, C. Havasy
{"title":"Decoupled electrical/thermal modeling of AlGaAs/GaAs heterojunction bipolar transistors","authors":"R. Anholt, C. Bozada, G. Desalvo, R. Dettmer, J. Ebel, J. Gillespie, C. Havasy","doi":"10.1109/GAAS.1996.567841","DOIUrl":null,"url":null,"abstract":"We describe a decoupled approach to modeling self heating effects in HBTs where we solve for average thermal impedances in three dimensions and solve the electrical problem at three fixed temperatures in two dimensions, then we find the self consistent solution of the temperature rise and current equations. Results are given for thermal impedances of thermally-shunted HBTs. Measured forward Gummel IV curves, IV curves for forced base currents, f/sub t/ values, and breakdown characteristics are compared with the model.","PeriodicalId":365997,"journal":{"name":"GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium. 18th Annual Technical Digest 1996","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium. 18th Annual Technical Digest 1996","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.1996.567841","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We describe a decoupled approach to modeling self heating effects in HBTs where we solve for average thermal impedances in three dimensions and solve the electrical problem at three fixed temperatures in two dimensions, then we find the self consistent solution of the temperature rise and current equations. Results are given for thermal impedances of thermally-shunted HBTs. Measured forward Gummel IV curves, IV curves for forced base currents, f/sub t/ values, and breakdown characteristics are compared with the model.