M. Billaud, T. Zimmer, D. Geoffroy, Y. Danto, H. Effinger, W. Seifert, J. Martinez, F. Gomez
{"title":"Real measures, virtual instruments","authors":"M. Billaud, T. Zimmer, D. Geoffroy, Y. Danto, H. Effinger, W. Seifert, J. Martinez, F. Gomez","doi":"10.1109/ICCDCS.2002.1004080","DOIUrl":null,"url":null,"abstract":"This paper presents the realisation of a remote lab on a European scale. The involved countries are France, Germany, and Spain. The architecture of the lab is described and the functionality has been tested. It concerns the instrumentation in the field of microelectronics. It has been applied to the characterisation of MOS transistors.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
This paper presents the realisation of a remote lab on a European scale. The involved countries are France, Germany, and Spain. The architecture of the lab is described and the functionality has been tested. It concerns the instrumentation in the field of microelectronics. It has been applied to the characterisation of MOS transistors.